Electron Microscopy

Combined Tilt- and Focal-Series Tomography for HAADF-STEM

Tim Dahmena1 c1, Holger Kohra2, Andrew R. Lupinia4, Jean-Pierre Baudoina5, Christian Kübela6, Patrick Tramperta1, Philipp Slusalleka1 and Niels de Jongea3

a1 German Research Center for Artificial Intelligence (DFKI) GmbH, 66123 Saarbrücken, Germany

a2 KTH Royal Institute of Technology, Lindstedtsvägen 25, Stockholm, SE 100 44, Sweden

a3 INM – Leibniz Institute for New Materials, 66123 Saarbrücken, Germany

a4 Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN 37831-6071

a5 Aix-Marseille Université, Faculté de Médecine, 27 Bd Jean Moulin, 13005 Marseille, France

a6 Karlsruhe Institute of Technology (KIT), Institute of Nanotechnology (INT) and Karlsruhe Nano Micro Facility (KNMF), 76344 Eggenstein-Leopoldshafen, Germany

Correspondence

c1 tim.dahmen@dfki.de

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