X-Ray Microscopy

Diffraction Contrast Tomography in the Laboratory – Applications and Future Directions

C. Holznera1, L. Laverya1 c1, H. Balea1, A. Merklea1, S. McDonalda2, P. Withersa2, Y. Zhanga3, D. Juul Jensena3, M. Kimuraa4, A. Lyckegaarda5, P. Reischiga5 and E.M. Lauridsena5

a1 Carl Zeiss X-ray Microscopy Inc., 4385 Hopyard Rd., Pleasanton, CA 94588

a2 Manchester X-ray Imaging Facility, School of Materials, University of Manchester, Manchester, M13 9PL, UK

a3 Department of Wind Energy, Technical University of Denmark, Fredriksborgvej 399, 4000 Roskilde, Denmark

a4 Institute of Materials Structure Science (IMSS), High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki, 305-0801, Japan

a5 Xnovo Technology ApS, Galoche Alle 15, 4600 Køge, Denmark

Correspondence

c1 leah.lavery@zeiss.com

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